TI/TI-N HF/HF-N AND W/W-N MULTILAYER FILMS WITH HIGH MECHANICAL HARDNESS

被引:110
作者
SHIH, KK
DOVE, DB
机构
[1] IBM Research Division, Thomas J. Watson Research Center, Yorktown Heights, NY 10598
关键词
D O I
10.1063/1.107812
中图分类号
O59 [应用物理学];
学科分类号
摘要
Ti/Ti-N, Hf/Hf-N, and W/W-N multilayer films with very thin individual metal and metal-nitride layers were developed, with hardness of the structure much higher than that of single-layer nitride films. Hardnesses with value between 3500 and 5000 kg/mm2 or higher were observed in the multilayer films. This is an improvement over that of single-layer metal-nitride films where hardnesses between 2200 and 2800 kg/mm2 are typically achieved. The improvement is thought to be due to the fact that the grains are restricted to a very small size in the thin individual layers of the sandwich structure. The multilayer films, in general, have better adhesion and less defects than the single-layer films. These films were prepared on room-temperature substrates by a simple sputtering process and have potential applications, as in hard coatings.
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页码:654 / 656
页数:3
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