MEMORY PHENOMENA IN REACTIVELY-EVAPORATED ALOX AND GEOX THIN-FILMS

被引：7

作者：

BEYNON, J

ELSAMANOUDY, MM

机构：

来源：

JOURNAL OF MATERIALS SCIENCE LETTERS | 1987年 / 6卷 / 12期

关键词：

D O I：

10.1007/BF01689318

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：1447 / 1449

页数：3

相关论文

共 12 条

[1] DIELECTRIC PROPERTIES OF ALUMINUM-OXIDE FILMS
BIREY, H
[J]. JOURNAL OF APPLIED PHYSICS, 1978, 49 (05) : 2898 - 2904
[2] ELECTRICAL-CONDUCTION AND CURRENT NOISE MECHANISM IN DISCONTINUOUS METAL-FILMS .1. THEORETICAL
CELASCO, M
MASOERO, A
MAZZETTI, P
STEPANESCU, A
[J]. PHYSICAL REVIEW B, 1978, 17 (06): : 2553 - 2563
[3] Dearnaley G., 1970, Journal of Non-Crystalline Solids, V4, P593, DOI 10.1016/0022-3093(70)90097-9
[4] CHARACTERIZATION OF AL-ALOX AND SN-SNOX CERMET FILMS DEPOSITED BY REACTIVE EVAPORATION
DEMIRYONT, H
TEZEY, N
[J]. THIN SOLID FILMS, 1983, 101 (04) : 345 - 356
[5] CONDUCTING FILAMENTS AND VOLTAGE-CONTROLLED NEGATIVE-RESISTANCE IN AL-AL2-O3-AU STRUCTURES WITH AMORPHOUS DIELECTRIC
EMMER, I
[J]. THIN SOLID FILMS, 1974, 20 (01) : 43 - 52
[6] EMMER I, 1970, PHYS STATUS SOLIDI A, V13, pK191
[7] VOLTAGE TEMPERATURE MEMORY AND PRESSURE VOLTAGE MEMORY EFFECTS IN COEVAPORATED FILMS OF SIO-TIO
HOGARTH, CA
ILYAS, M
[J]. THIN SOLID FILMS, 1983, 103 (03) : 267 - 274
[8] ELECTRICAL CONDUCTION MECHANISM IN ULTRATHIN, EVAPORATED METAL FILMS
NEUGEBAUER, CA
WEBB, MB
[J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (01) : 74 - &
[9] RALPH JE, 1972, J NONCRYST SOLIDS, V7, P236
[10] A CRITICAL-REVIEW OF THE OBSERVED ELECTRICAL-PROPERTIES OF MIM DEVICES SHOWING VCNR
RAY, AK
HOGARTH, CA
[J]. INTERNATIONAL JOURNAL OF ELECTRONICS, 1984, 57 (01) : 1 - 77