A CRITICAL-REVIEW OF THE OBSERVED ELECTRICAL-PROPERTIES OF MIM DEVICES SHOWING VCNR

[1] ELECTRON-EMISSION AND RELATED PROPERTIES OF AMORPHOUS THIN-FILMS OF MIXED BARIUM AND SILICON OXIDES [J]. THIN SOLID FILMS, 1974, 22 (02) : 203 - 214

[2] ELECTRONIC CONDUCTION THROUGH EVAPORATED SILICON OXIDE FILMS [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1971, 4 (07) : 988 - &

[3] ELECTRICAL-CONDUCTION IN DIELECTRICS AT HIGH FIELDS [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1975, 8 (05) : 551 - 560

[4] AMORPHOUS-SEMICONDUCTOR DEVICES [J]. SCIENTIFIC AMERICAN, 1977, 236 (05) : 36 - 48

[5] Adler D., 1971, Critical Reviews in Solid State Sciences, V2, DOI 10.1080/10408437108243545

[6] THICKNESS DEPENDENCE OF BREAKDOWN FIELD [J]. THIN SOLID FILMS, 1972, 13 (02) : S23 - S24

[7] A STUDY OF THE ELECTRICAL CHARACTERISTICS, BEFORE ELECTROFORMING, OF THIN SIOX FILMS WITH LATERALLY-SPACED ELECTRODES [J]. JOURNAL OF MATERIALS SCIENCE, 1983, 18 (09) : 2777 - 2784

[8] TEMPERATURE-DEPENDENCE OF VOLTAGE-CONTROLLED NEGATIVE-RESISTANCE IN AN ELECTROFORMED CU-SIOX-CU STRUCTURE [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1983, 76 (02): : 559 - 563

[9] METEORITES AND EARLY SOLAR SYSTEM [J]. ANNUAL REVIEW OF ASTRONOMY AND ASTROPHYSICS, 1971, 9 : 1 - &

[10] DIELECTRIC PROPERTIES OF THIN FILMS OF ALUMINIUM OXIDE AND SILICON OXIDE [J]. THIN SOLID FILMS, 1968, 2 (03) : 185 - &

[1] ELECTRON-EMISSION AND RELATED PROPERTIES OF AMORPHOUS THIN-FILMS OF MIXED BARIUM AND SILICON OXIDES [J]. THIN SOLID FILMS, 1974, 22 (02) : 203 - 214

[2] ELECTRONIC CONDUCTION THROUGH EVAPORATED SILICON OXIDE FILMS [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1971, 4 (07) : 988 - &

[3] ELECTRICAL-CONDUCTION IN DIELECTRICS AT HIGH FIELDS [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1975, 8 (05) : 551 - 560

[4] AMORPHOUS-SEMICONDUCTOR DEVICES [J]. SCIENTIFIC AMERICAN, 1977, 236 (05) : 36 - 48

[5] Adler D., 1971, Critical Reviews in Solid State Sciences, V2, DOI 10.1080/10408437108243545

[6] THICKNESS DEPENDENCE OF BREAKDOWN FIELD [J]. THIN SOLID FILMS, 1972, 13 (02) : S23 - S24

[7] A STUDY OF THE ELECTRICAL CHARACTERISTICS, BEFORE ELECTROFORMING, OF THIN SIOX FILMS WITH LATERALLY-SPACED ELECTRODES [J]. JOURNAL OF MATERIALS SCIENCE, 1983, 18 (09) : 2777 - 2784

[8] TEMPERATURE-DEPENDENCE OF VOLTAGE-CONTROLLED NEGATIVE-RESISTANCE IN AN ELECTROFORMED CU-SIOX-CU STRUCTURE [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1983, 76 (02): : 559 - 563

[9] METEORITES AND EARLY SOLAR SYSTEM [J]. ANNUAL REVIEW OF ASTRONOMY AND ASTROPHYSICS, 1971, 9 : 1 - &

[10] DIELECTRIC PROPERTIES OF THIN FILMS OF ALUMINIUM OXIDE AND SILICON OXIDE [J]. THIN SOLID FILMS, 1968, 2 (03) : 185 - &