ENHANCED ETCHING OF ION-IMPLANTED SILICON-NITRIDE IN BUFFERED HYDROFLUORIC-ACID

被引:8
作者
PARRY, PD
BRISTOL, SP
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1978年 / 15卷 / 02期
关键词
D O I
10.1116/1.569667
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:664 / 667
页数:4
相关论文
共 12 条
[1]  
AKASAKA Y, 1974, J JPN SOC APPL PHYS, V43, P493
[2]  
JACKSON JH, 1976, P 7 INT C EL ION BEA, P445
[3]  
Mayer J. W., 1970, ION IMPLANTATION SEM
[4]  
NISSE EPE, 1977, J APPL PHYS, V48, P3337
[5]  
OEN OS, 6 P INT C AT COLL SO
[6]   LOCALIZED SUBSTRATE HEATING DURING ION-IMPLANTATION [J].
PARRY, PD .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1978, 15 (01) :111-115
[7]  
PARRY PD, 1975, J VAC SCI TECHNOL, V13, P622
[8]   EVIDENCE FOR OXIDATION GROWTH AT THE OXIDE-SILICON INTERFACE FROM CONTROLLED ETCH STUDIES [J].
PLISKIN, WA ;
GNALL, RP .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1964, 111 (07) :872-873
[9]   ROTATING SCAN FOR ION-IMPLANTATION [J].
ROBERTSON, GI .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1975, 122 (06) :796-800
[10]   COMPUTER-SIMULATION OF ATOMIC-DISPLACEMENT CASCADES IN SOLIDS IN BINARY-COLLISION APPROXIMATION [J].
ROBINSON, MT ;
TORRENS, IM .
PHYSICAL REVIEW B, 1974, 9 (12) :5008-5024