DETERMINATION OF THE CRITICAL LAYER THICKNESS OF SI1-XGEX/SI HETEROSTRUCTURES BY DIRECT OBSERVATION OF MISFIT DISLOCATIONS

被引：77

作者：

KOHAMA, Y

FUKUDA, Y

SEKI, M

机构：

来源：

关键词：

D O I：

10.1063/1.99472

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：380 / 382

页数：3

共 18 条

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