UV MICROPROBE TECHNIQUE FOR MEASUREMENT OF MINORITY-CARRIER DIFFUSIOM LENGTH IN GAP P-N JUNCTION MATERIAL

被引：9

作者：

HWANG, CJ

HASZKO, SE

BERGH, AA

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1971年 / 42卷 / 12期

关键词：

D O I：

10.1063/1.1659900

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：5117 / +

页数：1

共 13 条

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