BAND OFFSETS IN GAAS/AMORPHOUS GE AND GAP/AMORPHOUS GE HETEROJUNCTIONS MEASURED BY INTERNAL PHOTOEMISSION

被引:14
作者
COLUZZA, C [1 ]
LAMA, F [1 ]
FROVA, A [1 ]
PERFETTI, P [1 ]
QUARESIMA, C [1 ]
CAPOZI, M [1 ]
机构
[1] CNR,IST STRUTTURA MAT,I-00064 FRASCATI,ITALY
关键词
D O I
10.1063/1.341506
中图分类号
O59 [应用物理学];
学科分类号
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页码:3304 / 3306
页数:3
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