MICRO-PIXE ANALYSIS OF IMPURITY DISTRIBUTIONS IN TREES GROWN IN HIGH-VOLTAGE CABLES

被引：4

作者：

HINRICHSEN, PF

KAJRYS, G

HOUDAYER, A

JEREMIE, A

BELHADFA, A

CRINE, JP

CAMPBELL, JL

机构：

[1] HYDRO QUEBEC RES INST,INST RECH ELECT QUEBEC,VP RECH,VARENNES J0L 2P0,QUEBEC,CANADA

[2] UNIV GUELPH,DEPT PHYS,GUELPH N1G 2W1,ONTARIO,CANADA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1990年 / 45卷 / 1-4期

关键词：

D O I：

10.1016/0168-583X(90)90893-Y

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Water treeing and electrical treeing are degradation processes occurring in the polyethylene insulation of underground high-voltage cables that can lead to premature breakdown. In order to determine the nature and content of impurities present in the trees, which typically have dimensions of 50-200 μm, a PIXE (proton-induced X-ray emission) microbeam system with a beam-spot diameter of less than 20 μm has been installed on a 4.5 MV Dynamitron accelerator. The capabilities of this system are illustrated by multi-element radial scans that show the presence of a wide variety of contaminants in the trees. © 1990.

引用

页码：532 / 535

页数：4

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