ROLE OF BIMOLECULAR RECOMBINATION IN PICOSECOND PHOTOINDUCED ABSORPTION OF HYDROGENATED AMORPHOUS-SILICON

被引:11
作者
JACKSON, WB
机构
[1] Xerox Palo Alto Research Cent, United States
关键词
12;
D O I
10.1080/09500838908206469
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:277 / 282
页数:6
相关论文
共 12 条
[1]   PICOSECOND PHOTOINDUCED ABSORPTION AS A PROBE OF METASTABLE LIGHT-INDUCED DEFECTS IN INTRINSIC HYDROGENATED AMORPHOUS-SILICON [J].
GUSTAFSON, TL ;
SCHER, H ;
ROBERTS, DM ;
COLLINS, RW .
PHYSICAL REVIEW LETTERS, 1988, 60 (02) :148-151
[2]   SYSTEMATIC INVESTIGATION OF PICOSECOND PHOTOINDUCED ABSORPTION IN HYDROGENATED AMORPHOUS-SILICON [J].
JACKSON, WB ;
DOLAND, C ;
TSAI, CC .
PHYSICAL REVIEW B, 1986, 34 (04) :3023-3026
[3]   ENERGY-DEPENDENCE OF THE OPTICAL MATRIX ELEMENT IN HYDROGENATED AMORPHOUS AND CRYSTALLINE SILICON [J].
JACKSON, WB ;
KELSO, SM ;
TSAI, CC ;
ALLEN, JW ;
OH, SJ .
PHYSICAL REVIEW B, 1985, 31 (08) :5187-5198
[4]   THERMALIZATION AND RECOMBINATION IN AMORPHOUS-SEMICONDUCTORS [J].
ORENSTEIN, J ;
KASTNER, MA .
SOLID STATE COMMUNICATIONS, 1981, 40 (01) :85-89
[5]   A MULTIPLE-TRAPPING MODEL WITH OPTICAL BIAS [J].
PANDYA, R ;
SCHIFF, EA .
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1985, 52 (06) :1075-1095
[6]  
ROBERTS DM, 1986, ULTRAFAST PHENOMENA, V5, P245
[7]   DISORDER EFFECTS ON DEEP TRAPPING IN AMORPHOUS-SEMICONDUCTORS [J].
STREET, RA .
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1984, 49 (01) :L15-L20
[8]   LIGHT-INDUCED METASTABLE DEFECTS IN HYDROGENATED AMORPHOUS-SILICON - A SYSTEMATIC STUDY [J].
STUTZMANN, M ;
JACKSON, WB ;
TSAI, CC .
PHYSICAL REVIEW B, 1985, 32 (01) :23-47
[9]   PICOSECOND TRAPPING OF PHOTOCARRIERS IN AMORPHOUS-SILICON [J].
VARDENY, Z ;
STRAIT, J ;
TAUC, J .
APPLIED PHYSICS LETTERS, 1983, 42 (07) :580-582
[10]   OPTICAL STUDIES OF EXCESS CARRIER RECOMBINATION IN A-SI-H - EVIDENCE FOR DISPERSIVE DIFFUSION [J].
VARDENY, Z ;
OCONNOR, P ;
RAY, S ;
TAUC, J .
PHYSICAL REVIEW LETTERS, 1980, 44 (19) :1267-1271