X-RAY PHOTOELECTRON DIFFRACTION FROM THE HGCDTE(111) SURFACE

被引：6

作者：

HERMAN, GS

FRIEDMAN, DJ

TRAN, TT

FADLEY, CS

GRANOZZI, G

RIZZI, GA

OSTERWALDER, J

BERNARDI, S

机构：

[1] UNIV PADUA,DIPARTMENTO CHIM,I-35100 PADUA,ITALY

[2] UNIV FRIBOURG,INST PHYS,CH-1700 FRIBOURG,SWITZERLAND

[3] TELECOMUNICAZIONI SPA,CTR STUDI,TURIN,ITALY

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1991年 / 9卷 / 03期

关键词：

D O I：

10.1116/1.585814

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The surface polarity of a mercury cadmium telluride (MCT) (111) crystal surface has been determined by x-ray photoelectron diffraction (XPD). Emission from the core levels of Hg, Cd, and Te gave reproducible photoelectron diffraction patterns with considerable fine structure. Comparisons between experiment and single scattering cluster calculations via R factors very well distinguished the different kinds of lattice sites of Cd, Hg, and Te, and also permitted unambiguously assigning a cationic termination to the sample studied. This is thus a demonstration of the capability of XPD to study the type of termination involved at MCT and other compound semiconductor surfaces.

引用

页码：1870 / 1873

页数：4

共 18 条

[1] XPS STOICHIOMETRY MEASUREMENTS ON SURFACES OF III-V CRYSTALLINE COMPOUNDS [J].