LASER PLASMA SOURCES FOR PROXIMITY PRINTING OR PROJECTION X-RAY-LITHOGRAPHY

被引:28
作者
CHAKER, M [1 ]
LAFONTAINE, B [1 ]
COTE, CY [1 ]
KIEFFER, JC [1 ]
PEPIN, H [1 ]
TALON, MH [1 ]
ENRIGHT, GD [1 ]
VILLENEUVE, DM [1 ]
机构
[1] NATL RES COUNCIL CANADA,OTTAWA K1A 0R6,ONTARIO,CANADA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1992年 / 10卷 / 06期
关键词
D O I
10.1116/1.585921
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this article, we present a theoretical and experimental study of the x-ray emission produced by laser plasma sources in different spectral ranges appropriate for x-ray lithography either in proximity printing (XRL) or projection (XRPL) approaches. For XRPL application, experiments using 10 ns laser pulses show that the maximum conversion efficiency in the (80-250 eV) range is attained at I = 10(11) W cm-2 whereas for 25 ns pulses and I less-than-or-equal-to 6 X 10(11) W cm-2, it is still increasing with laser intensity. On the other hand, higher laser intensities are required to obtain a high conversion efficiency for XRL (0.9-1.4 keV). Efficient emission peaked at 1.1 keV can be achieved for I > 10(13) W cm-2 with copper targets and pulse duration shorter than 5 ns. For iron line emission (peak at 0.9 keV), the laser intensity can be lower (I = 5 X 10(12) W cm-2) and the pulse duration longer (tau(p) = 10 ns). Finally, we discuss the different approaches which may lead to the appropriate laser design.
引用
收藏
页码:3239 / 3242
页数:4
相关论文
共 27 条
  • [1] X-RAY CONVERSION EFFICIENCY AS A FUNCTION OF ATOMIC-NUMBER FOR 0.26-MU-M-LASER - IRRADIATED TARGETS
    ALATERRE, P
    PEPIN, H
    FABBRO, R
    FARAL, B
    [J]. PHYSICAL REVIEW A, 1986, 34 (05): : 4184 - 4194
  • [2] EFFICIENT KEV X-RAY GENERATION FROM 50 MJ KRF LASER PLASMAS
    BROUGHTON, JN
    FEDOSEJEVS, R
    [J]. APPLIED PHYSICS LETTERS, 1992, 60 (15) : 1818 - 1820
  • [3] CEGLIO NM, 1991, P OSA, V12, P5
  • [4] CERJAN C, 1991, P SOFT XRAY PROJECTI, V12, P72
  • [5] LASER PLASMA X-RAY SOURCES FOR MICROLITHOGRAPHY
    CHAKER, M
    PEPIN, H
    BAREAU, V
    LAFONTAINE, B
    TOUBHANS, I
    FABBRO, R
    FARAL, B
    [J]. JOURNAL OF APPLIED PHYSICS, 1988, 63 (03) : 892 - 899
  • [6] CALIBRATED SOFT-X-RAY SPECTROSCOPY USING TRANSMISSION GRATING, PINHOLE AND FILM
    CHAKER, M
    BAREAU, V
    KIEFFER, JC
    PEPIN, H
    JOHNSTON, TW
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1989, 60 (11) : 3386 - 3390
  • [7] Chaker M., 1988, Proceedings of the SPIE - The International Society for Optical Engineering, V831, P237, DOI 10.1117/12.965043
  • [8] X-ray wavelength optimization of the laser plasma X-ray lithography source
    Chaker, M.
    Boily, S.
    Lafontaine, B.
    Kieffer, J.C.
    Pepin, H.
    Toubhans, I.
    Fabbro, R.
    [J]. Microelectronic Engineering, 1990, 10 (02) : 91 - 105
  • [9] PLASMA X-RAY SOURCE FOR LITHOGRAPHY GENERATED BY A-ALMOST-EQUAL-TO-30 J, 30 NS KRF LASER
    DAVIS, GM
    GOWER, MC
    ONEILL, F
    TURCU, ICE
    [J]. APPLIED PHYSICS LETTERS, 1988, 53 (17) : 1583 - 1585
  • [10] CONVERSION OF LASER-LIGHT INTO SOFT X-RAYS WITH 3-NS AND 30-PS LASER-PULSES
    EIDMANN, K
    SCHWANDA, W
    [J]. LASER AND PARTICLE BEAMS, 1991, 9 (02) : 551 - 562