DEFECT REDUCTION BY THERMAL ANNEALING OF GAAS-LAYERS GROWN BY MOLECULAR-BEAM EPITAXY ON SI SUBSTRATES

被引:197
作者
LEE, JW
SHICHIJO, H
TSAI, HL
MATYI, RJ
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D O I
10.1063/1.98117
中图分类号
O59 [应用物理学];
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页码:31 / 33
页数:3
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