CONTROL OF PREFERENTIALLY ORIENTED CRYSTAL-GROWTH OF TITANIUM NITRIDE - EFFECTS OF NITROGEN ADSORPTION AND ION-BEAM IRRADIATION IN DYNAMIC MIXING PROCESS

被引:19
作者
KIUCHI, M [1 ]
CHAYAHARA, A [1 ]
HORINO, Y [1 ]
FUJII, K [1 ]
SATOU, M [1 ]
ENSINGER, W [1 ]
机构
[1] UNIV HEIDELBERG,INST PHYS CHEM,W-6900 HEIDELBERG,GERMANY
关键词
D O I
10.1016/0169-4332(92)90509-V
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Titanium nitride films which are deposited on a Si wafer by titanium evaporation and simultaneous nitrogen ion-beam irradiation have preferred orientations, which depend on Ti atom/N+ ion arrival ratio. The effects of nitrogen pressure and ion beam irradiation are discussed to clarify the mechanism of the variation of crystallization. Nitridation with adsorbed nitrogen leads to [111]-oriented TiN crystal growth. Ion bombardment induces [100]-oriented TiN crystal growth. This effect is covered by the nitridation with adsorbed nitrogen, for higher nitrogen pressure case. The difference in the growth rates of [111]-oriented crystals and that of [100]-oriented crystals leads to the variation of preferred orientations, and so the control of the orientation of crystal growth is available.
引用
收藏
页码:760 / 764
页数:5
相关论文
共 12 条
[11]  
Scherrer P., 1918, GO TTINGER NACHRICHT, V26, P98
[12]   ELECTRICAL CHARACTERISTICS OF TIN CONTACTS TO N-SILICON [J].
WITTMER, M ;
STUDER, B ;
MELCHIOR, H .
JOURNAL OF APPLIED PHYSICS, 1981, 52 (09) :5722-5726