GAMMA-INDUCED DOSE FLUCTUATIONS IN A CHARGE INJECTION DEVICE

被引：12

作者：

BURKE, EA

BENDER, GE

PIMBLEY, JK

SUMMERS, GP

DALE, CJ

XAPSOS, MA

MARSHALL, PW

机构：

[1] SACHS FREEMAN ASSOCIATES,LANDOVER,MD 20785

[2] USN,RES LAB,WASHINGTON,DC 20375

[3] GE,PITTSFIELD,MA 01201

[4] RENSSELAER POLYTECH INST,TROY,NY 12181

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1988年 / 35卷 / 06期

关键词：

* This research was funded in part by ONR and by the NRL/ONT Spacecraft Survivabilityflulnerability Program;

D O I：

10.1109/23.25456

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1302 / 1306

页数：5

共 12 条

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BURKE EA, 1981, IEEE T NUCL SCI, V28, P4068

[5]

Castillo E., 1988, EXTREME VALUE THEORY

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Gumbel E J., 1958, STAT EXTREMES

[7]

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[9] CHARGE DETECTION MODELING IN SOLID-STATE IMAGE SENSORS [J].

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MICHON, GJ .

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[10] SCALING OF GAMMA-DOSE RATE UPSET THRESHOLD IN HIGH-DENSITY MEMORIES [J].

VAIL, PJ ;

BURKE, EA ;

RAYMOND, JP .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1983, 30 (06) :4240-4245

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