THERMAL CAPTURE OF ELECTRONS AND HOLES AT ZINC CENTERS IN SILICON

被引:22
作者
HERMAN, JM
SAH, CT
机构
[1] UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
[2] UNIV ILLINOIS,MAT RES LAB,URBANA,IL 61801
关键词
D O I
10.1016/0038-1101(73)90140-8
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1133 / 1139
页数:7
相关论文
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