DIRECT LIFETIME MEASUREMENTS AND INTERACTIONS OF CHARGED DEFECT STATES IN SUBMICRON JOSEPHSON-JUNCTIONS

被引：61

作者：

WAKAI, RT ^{[1
]}

VANHARLINGEN, DJ ^{[1
]}

机构：

[1] UNIV ILLINOIS,MAT RES LAB,URBANA,IL 61801

来源：

PHYSICAL REVIEW LETTERS | 1987年 / 58卷 / 16期

关键词：

D O I：

10.1103/PhysRevLett.58.1687

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：1687 / 1690

页数：4

共 9 条

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WAKAI RT, 1986, APPL PHYS LETT, V49, P595

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