A NEW APPLICATION OF ELECTRON-ENERGY LOSS SPECTROSCOPY TECHNIQUE FOR A NONDESTRUCTIVE STUDY OF THE SI-SIO2 INTERFACE

被引：21

作者：

ITO, T

IWAMI, M

HIRAKI, A

机构：

来源：

SOLID STATE COMMUNICATIONS | 1980年 / 36卷 / 08期

关键词：

D O I：

10.1016/0038-1098(80)90211-2

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

收藏

页码：695 / 699

页数：5

相关论文

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