ANALYSIS OF THIN-LAYERS BY TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY

被引：11

作者：

HOFFMANN, P

LIESER, KH

HEIN, M

FLAKOWSKI, M

机构：

来源：

关键词：

D O I：

10.1016/0584-8547(89)80052-7

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：471 / 476

页数：6

共 8 条

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[2]

PRANGE A, 1987, GIT FACHZ LAB, V31, P513

[3]

Pruppacher H. R., 1999, J ATMOS CHEM, V32, P420, DOI [10.1023/A:1000652616430, DOI 10.1023/A:1000652616430]

[4] PERSPEX AS SAMPLE CARRIER IN TXRF [J].

SCHMITT, M ;

HOFFMANN, P ;

LIESER, KH .

FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1987, 328 (07) :594-595

[5] TOTAL REFLECTION X-RAY-FLUORESCENCE ANALYSIS OF LOW-Z ELEMENTS [J].

STRELI, C ;

AIGINGER, H ;

WOBRAUSCHEK, P .

[6] OPTICAL FLATS FOR USE IN X-RAY SPECTROCHEMICAL MICROANALYSIS [J].

YONEDA, Y ;

HORIUCHI, T .

[7]

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[8]

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