TOTAL REFLECTION X-RAY-FLUORESCENCE ANALYSIS OF LOW-Z ELEMENTS

被引：24

作者：

STRELI, C

AIGINGER, H

WOBRAUSCHEK, P

机构：

来源：

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 1989年 / 44卷 / 05期

关键词：

D O I：

10.1016/0584-8547(89)80055-2

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：491 / 497

页数：7

共 14 条

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[7] A HIGHLY SENSITIVE ENERGY-DISPERSIVE X-RAY SPECTROMETER WITH MULTIPLE TOTAL REFLECTION OF THE EXCITING BEAM [J].

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[8]

STRELI C, 1986, GRADUATE WORK

[9] X-RAY-FLUORESCENCE ANALYSIS IN THE NG REGION USING TOTAL REFLECTION OF THE PRIMARY BEAM [J].

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[10] TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRIC DETERMINATION OF ELEMENTS IN NANOGRAM AMOUNTS [J].

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