A SIMPLE ADAPTATION OF THE CARBON REPLICA TECHNIQUE FOR THE EXAMINATION OF SELECTED AREAS IN THE ELECTRON MICROSCOPE

被引：16

作者：

BRADLEY, DE

机构：

来源：

BRITISH JOURNAL OF APPLIED PHYSICS | 1955年 / 6卷 / 12期

关键词：

D O I：

10.1088/0508-3443/6/12/305

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：430 / 432

页数：3

共 7 条

[1] A METHOD OF EXAMINING SELECTED AREAS OF SURFACES USING REPLICAS AND THE ELECTRON MICROSCOPE
BOOKER, GR
[J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1954, 5 (OCT): : 349 - 350
[2] BRADLEY DA, UNPUBLISHED
[3] EVAPORATED CARBON FILMS FOR USE IN ELECTRON MICROSCOPY
BRADLEY, DE
[J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1954, 5 (FEB): : 65 - 69
[4] BRADLEY DE, 1954, J I MET, V83, P35
[5] A METHOD FOR THE ELECTRON AND OPTICAL MICROSCOPIC EXAMINATION OF IDENTICAL AREAS
HYAM, ED
NUTTING, J
[J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1952, 3 (JUN): : 173 - 176
[6] A METHOD OF OBSERVING SELECTED AREAS IN ELECTRON AND OPTICAL MICROSCOPES
NANKIVELL, JF
[J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1953, 4 (MAY): : 141 - 143
[7] NUTTING J, 1950, MONOGR REP SER I MET, V8, P65