MONITORING THE GROWTH OF AN OXIDE FILM ON ALUMINUM INSITU WITH THE QUARTZ CRYSTAL MICROBALANCE

被引:26
作者
DEAKIN, MR [1 ]
MELROY, OR [1 ]
机构
[1] IBM CORP,ALMADEN RES CTR,DIV RES,SAN JOSE,CA 95120
关键词
D O I
10.1149/1.2096633
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
引用
收藏
页码:349 / 352
页数:4
相关论文
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