SCATTERING RECOIL COINCIDENCE SPECTROMETRY - A NEW EXPERIMENTAL-TECHNIQUE FOR PROFILING HYDROGEN ISOTOPES IN LOW-Z THIN-FILMS

被引：4

作者：

FORSTER, JS ^{[1
]}

LESLIE, JR ^{[1
]}

LAURSEN, T ^{[1
]}

机构：

[1] QUEENS UNIV,DEPT PHYS,KINGSTON K7L 3N6,ONTARIO,CANADA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1990年 / 45卷 / 1-4期

关键词：

D O I：

10.1016/0168-583X(90)90811-8

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The new technique for profiling light elements in thin, self-supporting foils, which uses a coincidence measurement over very large solid angles, has been demonstrated experimentally. A beam of 2.0 MeV 4He particles was used to bombard films of (i) cracked ethylene and (ii) evaporated carbon which was subsequently implanted with 7.5 keV 1H+ ions to a concentration of 1017/cm2. Plots of Eα vs Ep clearly show the 1H distributions in the foil. © 1990.

引用

页码：176 / 180

页数：5

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