PHOTOEMISSION AND BAND-STRUCTURE RESULTS FOR NISI-2

[1] Abbati I., 1980, Journal of the Physical Society of Japan, V49, P1071

[2] MEAN-VALUE POINT IN BRILLOUIN ZONE [J]. PHYSICAL REVIEW B, 1973, 7 (12) : 5212 - 5215

[3] BISI O, J PHYS C

[4] CHABAL YJ, PHYS REV B

[5] SPECIAL POINTS IN BRILLOUIN ZONE [J]. PHYSICAL REVIEW B, 1973, 8 (12): : 5747 - 5753

[6] INTERFACIAL ORDER IN EPITAXIAL NISI2 [J]. APPLIED PHYSICS LETTERS, 1980, 36 (07) : 544 - 547

[7] INTERFACE AND SURFACE-STRUCTURE OF EPITAXIAL NISI2 FILMS [J]. APPLIED PHYSICS LETTERS, 1981, 38 (12) : 988 - 990

[8] MICROSCOPIC COMPOUND FORMATION AT THE PD-SI(111) INTERFACE [J]. PHYSICAL REVIEW LETTERS, 1979, 43 (24) : 1836 - 1839

[9] XPS STUDY OF THE CHEMICAL-STRUCTURE OF THE NICKEL-SILICON INTERFACE [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1980, 17 (05): : 924 - 929

[10] SEMICONDUCTOR CHARGE-DENSITIES WITH HARD-CORE AND SOFT-CORE PSEUDOPOTENTIALS [J]. PHYSICAL REVIEW LETTERS, 1979, 42 (10) : 662 - 665

[1] Abbati I., 1980, Journal of the Physical Society of Japan, V49, P1071

[2] MEAN-VALUE POINT IN BRILLOUIN ZONE [J]. PHYSICAL REVIEW B, 1973, 7 (12) : 5212 - 5215

[3] BISI O, J PHYS C

[4] CHABAL YJ, PHYS REV B

[5] SPECIAL POINTS IN BRILLOUIN ZONE [J]. PHYSICAL REVIEW B, 1973, 8 (12): : 5747 - 5753

[6] INTERFACIAL ORDER IN EPITAXIAL NISI2 [J]. APPLIED PHYSICS LETTERS, 1980, 36 (07) : 544 - 547

[7] INTERFACE AND SURFACE-STRUCTURE OF EPITAXIAL NISI2 FILMS [J]. APPLIED PHYSICS LETTERS, 1981, 38 (12) : 988 - 990

[8] MICROSCOPIC COMPOUND FORMATION AT THE PD-SI(111) INTERFACE [J]. PHYSICAL REVIEW LETTERS, 1979, 43 (24) : 1836 - 1839

[9] XPS STUDY OF THE CHEMICAL-STRUCTURE OF THE NICKEL-SILICON INTERFACE [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1980, 17 (05): : 924 - 929

[10] SEMICONDUCTOR CHARGE-DENSITIES WITH HARD-CORE AND SOFT-CORE PSEUDOPOTENTIALS [J]. PHYSICAL REVIEW LETTERS, 1979, 42 (10) : 662 - 665