NANO-CALIBRATION FOR STYLUS-BASED SURFACE MEASUREMENT

被引:4
作者
WHITEHOUSE, DJ
BOWEN, DK
CHETWYND, DG
DAVIES, ST
机构
[1] Univ of Warwick, Conventry, Engl, Univ of Warwick, Conventry, Engl
来源
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1988年 / 21卷 / 01期
关键词
D O I
10.1088/0022-3735/21/1/005
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
14
引用
收藏
页码:46 / 51
页数:6
相关论文
共 14 条
[1]  
BISHOP RED, 1960, MECHANICS VIBRATION
[2]  
Bowen D. K., 1985, Proceedings of the SPIE - The International Society for Optical Engineering, V563, P412
[3]   X-RAY INTERFEROMETER CALIBRATION OF MICRODISPLACEMENT TRANSDUCERS [J].
CHETWYND, DG ;
SIDDONS, DP ;
BOWEN, DK .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1983, 16 (09) :871-874
[4]  
CHETWYND DG, 1987, P SPIE, V732
[5]  
DAVIES ST, 1987, 4TH INT S OPT OPT AP
[6]   X-RAY TO VISIBLE WAVELENGTH RATIOS [J].
DESLATTES, RD ;
HENINS, A .
PHYSICAL REVIEW LETTERS, 1973, 31 (16) :972-975
[7]  
FRANKS A, 1984, P INT S QUALITY CONT, P8
[8]   AN ANGSTROM RULER [J].
HART, M .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1968, 1 (11) :1405-&
[9]  
NICHOLAS, 1968, 26 RANK PREC IND APP
[10]   DESIGN AND ASSESSMENT OF MONOLITHIC HIGH-PRECISION TRANSLATION MECHANISMS [J].
SMITH, ST ;
CHETWYND, DG ;
BOWEN, DK .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1987, 20 (08) :977-983