SCANNING TUNNELING MICROSCOPE TIP STRUCTURES

被引：25

作者：

NICOLAIDES, R

LIANG, Y

PACKARD, WE

FU, ZW

BLACKSTEAD, HA

CHIN, KK

DOW, JD

FURDYNA, JK

HU, WM

JAKLEVIC, RC

KAISER, WJ

PELTON, AR

ZELLER, MV

BELLINA, J

机构：

[1] UNIV NOTRE DAME,DEPT PHYS,NOTRE DAME,IN 46556

[2] UNIV NOTRE DAME,DEPT MAT SCI,NOTRE DAME,IN 46556

[3] UNIV NOTRE DAME,COLL ENGN,NOTRE DAME,IN 46556

[4] ST MARYS COLL,DEPT PHYS & CHEM,NOTRE DAME,IN 46556

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1988年 / 6卷 / 02期

关键词：

D O I：

10.1116/1.575392

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：445 / 447

页数：3

共 10 条

[1] ION MILLED TIPS FOR SCANNING TUNNELING MICROSCOPY
BIEGELSEN, DK
PONCE, FA
TRAMONTANA, JC
KOCH, SM
[J]. APPLIED PHYSICS LETTERS, 1987, 50 (11) : 696 - 698
[2] THEORY OF SCANNING TUNNELING SPECTROSCOPY
CHEN, CJ
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02): : 319 - 322
[3] OXIDE-FREE TIP FOR SCANNING TUNNELING MICROSCOPY
COLTON, RJ
BAKER, SM
BALDESCHWIELER, JD
KAISER, WJ
[J]. APPLIED PHYSICS LETTERS, 1987, 51 (05) : 305 - 307
[4] IMAGING GRAPHITE IN AIR BY SCANNING TUNNELING MICROSCOPY - ROLE OF THE TIP
COLTON, RJ
BAKER, SM
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BALDESCHWIELER, JD
KAISER, WJ
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02): : 349 - 353
[5] SURFACE-MORPHOLOGY OF GAAS(110) BY SCANNING TUNNELING MICROSCOPY
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[6] TUNNELING SPECTROSCOPY OF THE GAAS(110) SURFACE
FEENSTRA, RM
STROSCIO, JA
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1987, 5 (04): : 923 - 929
[7] JAKLEVIC RC, IN PRESS PHYS REV LE
[8] THE SIGNATURE OF POINT-DEFECTS IN LAYERED MATERIALS
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HARRISON, WA
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02): : 300 - 304
[9] MULLER EW, 1969, FIELD ION MICROSCOPY, P122
[10] YASHINO Y, 1964, OYO BUTSURI, V33, P912