学术探索
学术期刊
新闻热点
数据分析
智能评审
立即登录
PROCESS-CONTROLS FOR RADIATION-HARDENED ALUMINUM GATE BULK SILICON CMOS
被引:21
作者
:
GREGORY, BL
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS, ALBUQUERQUE, NM 87115 USA
SANDIA LABS, ALBUQUERQUE, NM 87115 USA
GREGORY, BL
[
1
]
机构
:
[1]
SANDIA LABS, ALBUQUERQUE, NM 87115 USA
来源
:
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
|
1975年
/ 22卷
/ 06期
关键词
:
D O I
:
10.1109/TNS.1975.4328122
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:2295 / 2302
页数:8
相关论文
共 14 条
[1]
AUBUCHON K, 1971, IEEE T NUCL SCI, V18
[2]
SURFACE STATES AT STEAM-GROWN SILICON-SILICON DIOXIDE INTERFACES
BERGLUND, CN
论文数:
0
引用数:
0
h-index:
0
BERGLUND, CN
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1966,
ED13
(10)
: 701
-
+
[3]
RADIATION FAILURE MODES IN CMOS INTEGRATED-CIRCUITS
BURGHARD, RA
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS, ALBUQUERQUE, NM 87115 USA
SANDIA LABS, ALBUQUERQUE, NM 87115 USA
BURGHARD, RA
GWYN, CW
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS, ALBUQUERQUE, NM 87115 USA
SANDIA LABS, ALBUQUERQUE, NM 87115 USA
GWYN, CW
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1973,
NS20
(06)
: 300
-
306
[4]
SEM IRRADIATION FOR HARDNESS ASSURANCE SCREENING AND PROCESS DEFINITION
COHEN, S
论文数:
0
引用数:
0
h-index:
0
机构:
RCA,SOLID STATE TECHNOL CTR,SOMERVILLE,NJ 08876
COHEN, S
HUGHES, H
论文数:
0
引用数:
0
h-index:
0
机构:
RCA,SOLID STATE TECHNOL CTR,SOMERVILLE,NJ 08876
HUGHES, H
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1974,
NS21
(06)
: 387
-
389
[5]
PROCESS OPTIMIZATION OF RADIATION-HARDENED CMOS INTEGRATED-CIRCUITS
DERBENWICK, GF
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS, ALBUQUERQUE, NM 87115 USA
SANDIA LABS, ALBUQUERQUE, NM 87115 USA
DERBENWICK, GF
GREGORY, BL
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS, ALBUQUERQUE, NM 87115 USA
SANDIA LABS, ALBUQUERQUE, NM 87115 USA
GREGORY, BL
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1975,
22
(06)
: 2151
-
2156
[6]
SENSITIVE TECHNIQUE FOR STUDYING ION-IMPLANTATION DAMAGE
EERNISSE, EP
论文数:
0
引用数:
0
h-index:
0
EERNISSE, EP
[J].
APPLIED PHYSICS LETTERS,
1971,
18
(12)
: 581
-
&
[7]
DESIGN OPTIMIZATION OF RADIATION-HARDENED CMOS INTEGRATED-CIRCUITS
FOSSUM, JG
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
FOSSUM, JG
DERBENWICK, GF
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
DERBENWICK, GF
GREGORY, BL
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
GREGORY, BL
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1975,
22
(06)
: 2208
-
2213
[8]
HUGHES H, 1972, IEEE T NUCL SCI, V19
[9]
A QUASI-STATIC TECHNIQUE FOR MOS C-V AND SURFACE STATE MEASUREMENTS
KUHN, M
论文数:
0
引用数:
0
h-index:
0
KUHN, M
[J].
SOLID-STATE ELECTRONICS,
1970,
13
(06)
: 873
-
+
[10]
MACK C, 1975, ESSENTIALS STATISTIC, P153
←
1
2
→
共 14 条
[1]
AUBUCHON K, 1971, IEEE T NUCL SCI, V18
[2]
SURFACE STATES AT STEAM-GROWN SILICON-SILICON DIOXIDE INTERFACES
BERGLUND, CN
论文数:
0
引用数:
0
h-index:
0
BERGLUND, CN
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1966,
ED13
(10)
: 701
-
+
[3]
RADIATION FAILURE MODES IN CMOS INTEGRATED-CIRCUITS
BURGHARD, RA
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS, ALBUQUERQUE, NM 87115 USA
SANDIA LABS, ALBUQUERQUE, NM 87115 USA
BURGHARD, RA
GWYN, CW
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS, ALBUQUERQUE, NM 87115 USA
SANDIA LABS, ALBUQUERQUE, NM 87115 USA
GWYN, CW
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1973,
NS20
(06)
: 300
-
306
[4]
SEM IRRADIATION FOR HARDNESS ASSURANCE SCREENING AND PROCESS DEFINITION
COHEN, S
论文数:
0
引用数:
0
h-index:
0
机构:
RCA,SOLID STATE TECHNOL CTR,SOMERVILLE,NJ 08876
COHEN, S
HUGHES, H
论文数:
0
引用数:
0
h-index:
0
机构:
RCA,SOLID STATE TECHNOL CTR,SOMERVILLE,NJ 08876
HUGHES, H
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1974,
NS21
(06)
: 387
-
389
[5]
PROCESS OPTIMIZATION OF RADIATION-HARDENED CMOS INTEGRATED-CIRCUITS
DERBENWICK, GF
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS, ALBUQUERQUE, NM 87115 USA
SANDIA LABS, ALBUQUERQUE, NM 87115 USA
DERBENWICK, GF
GREGORY, BL
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS, ALBUQUERQUE, NM 87115 USA
SANDIA LABS, ALBUQUERQUE, NM 87115 USA
GREGORY, BL
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1975,
22
(06)
: 2151
-
2156
[6]
SENSITIVE TECHNIQUE FOR STUDYING ION-IMPLANTATION DAMAGE
EERNISSE, EP
论文数:
0
引用数:
0
h-index:
0
EERNISSE, EP
[J].
APPLIED PHYSICS LETTERS,
1971,
18
(12)
: 581
-
&
[7]
DESIGN OPTIMIZATION OF RADIATION-HARDENED CMOS INTEGRATED-CIRCUITS
FOSSUM, JG
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
FOSSUM, JG
DERBENWICK, GF
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
DERBENWICK, GF
GREGORY, BL
论文数:
0
引用数:
0
h-index:
0
机构:
SANDIA LABS,ALBUQUERQUE,NM 87115
SANDIA LABS,ALBUQUERQUE,NM 87115
GREGORY, BL
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1975,
22
(06)
: 2208
-
2213
[8]
HUGHES H, 1972, IEEE T NUCL SCI, V19
[9]
A QUASI-STATIC TECHNIQUE FOR MOS C-V AND SURFACE STATE MEASUREMENTS
KUHN, M
论文数:
0
引用数:
0
h-index:
0
KUHN, M
[J].
SOLID-STATE ELECTRONICS,
1970,
13
(06)
: 873
-
+
[10]
MACK C, 1975, ESSENTIALS STATISTIC, P153
←
1
2
→