CHEMICAL-BOND AND RELATED PROPERTIES OF SIO2 .8. EXPERIMENTAL AND THEORETICAL INVESTIGATION OF THE STRUCTURE OF SIOX

被引：23

作者：

ENGELKE, R

ROY, T

NEUMANN, HG

HUBNER, K

机构：

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1981年 / 65卷 / 01期

关键词：

D O I：

10.1002/pssa.2210650132

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：271 / 280

页数：10

相关论文

共 28 条

[1] A STUDY OF AMORPHOUS SIO
BRADY, GW
[J]. JOURNAL OF PHYSICAL CHEMISTRY, 1959, 63 (07) : 1119 - 1120
[2] THE STABILITY OF SIO SOLID AND GAS
BREWER, L
EDWARDS, RK
[J]. JOURNAL OF PHYSICAL CHEMISTRY, 1954, 58 (04) : 351 - 358
[3] VACUUM UV PHOTOELECTRON-SPECTRUM OF SIO(X1 SIGMA-+) MOLECULE
COLBOURN, EA
DYKE, JM
LEE, EPF
MORRIS, A
TRICKLE, IR
[J]. MOLECULAR PHYSICS, 1978, 35 (03) : 873 - 882
[4] STRUCTURE OF SILICON OXIDE FILMS
COLEMAN, MV
THOMAS, DJD
[J]. PHYSICA STATUS SOLIDI, 1967, 22 (02): : 593 - &
[5] STRUCTURAL MODELS FOR AMORPHOUS-SEMICONDUCTORS AND INSULATORS
CONNELL, GAN
LUCOVSKY, G
[J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 1978, 31 (1-2) : 123 - 155
[6] FUSCHILLO N, 1965, J APPL PHYS, V36, P574
[7] ELECTRON-DIFFRACTION STUDY OF AMORPHOUS SILICON-OXIDE FILMS
GEORGE, CF
DANTONIO, P
[J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 1979, 34 (03) : 323 - 334
[8] GRACZYK JF, 1976, PHYSICS STRUCTURALLY, P7
[9] REVISED PARAMETERS OF ANALYTIC FITS FOR COHERENT AND INCOHERENT SCATTERED X-RAY INTENSITIES OF FIRST 36 ATOMS
HAJDU, F
[J]. ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1972, 28 (03) : 250 - &
[10] CHEMICAL-BOND AND RELATED PROPERTIES OF SIO2 .7. STRUCTURE AND ELECTRONIC PROPERTIES OF THE SIOX REGION OF SI-SIO2 INTERFACES
HUBNER, K
[J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1980, 61 (02): : 665 - 673