The evaluation of the defects in fast neutron irradiated semi-insulating GaAs was studied using thermally stimulated current (TSC) and photoluminescence (PL) methods. A new TSC peak is observed at an annealing stage between 550 and 600-degrees-C. This peak is associated with a Ga(As)-X complex defect, which might include X as the gallium vacancy, according to both the analysis of the activation energy and the annealing behavior of the PL emission. A prominent TSC peak is also observed in as-irradiated samples, showing the creation of an As(Ga)-V(As) complex.