THERMALLY STIMULATED CURRENT IN FAST-NEUTRON IRRADIATED SEMIINSULATING GAAS - GA ANTISITE RELATED NEW TRAP

被引:12
作者
KURIYAMA, K
TOMIZAWA, K
KOGA, K
HAYASHI, N
WATANABE, H
IKEDA, Y
MAEKAWA, H
机构
[1] HOSEI UNIV,ION BEAM TECHNOL RES CTR,KOGANEI,TOKYO 184,JAPAN
[2] ELECTROTECH LAB,TSUKUBA,IBARAKI 319,JAPAN
[3] JAPAN ATOM ENERGY RES INST,TOKAI,IBARAKI 31911,JAPAN
关键词
D O I
10.1063/1.110616
中图分类号
O59 [应用物理学];
学科分类号
摘要
The evaluation of the defects in fast neutron irradiated semi-insulating GaAs was studied using thermally stimulated current (TSC) and photoluminescence (PL) methods. A new TSC peak is observed at an annealing stage between 550 and 600-degrees-C. This peak is associated with a Ga(As)-X complex defect, which might include X as the gallium vacancy, according to both the analysis of the activation energy and the annealing behavior of the PL emission. A prominent TSC peak is also observed in as-irradiated samples, showing the creation of an As(Ga)-V(As) complex.
引用
收藏
页码:1966 / 1968
页数:3
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