共 15 条
[1]
ELIMINATION OF CHARGING IN PROTON-INDUCED X-RAY-EMISSION ANALYSIS OF INSULATING SAMPLES
[J].
NUCLEAR INSTRUMENTS & METHODS,
1975, 131 (02)
:377-379
[2]
BEEZHOLD W, 1973, INT C ION BEAM SURFA
[3]
CAHILL TA, 1975, NEW USES ION ACCELER, P1
[4]
DECONNINCK G, 1975, ATOM ENERGY REV, V13, P367
[5]
PROTON-INDUCED X-RAY-EMISSION AS A TOOL FOR TRACE-ELEMENT ANALYSIS
[J].
NUCLEAR INSTRUMENTS & METHODS,
1974, 116 (03)
:487-499
[6]
SENSITIVITY IN TRACE-ELEMENT ANALYSIS BY P, ALPHA AND O-16 INDUCED X-RAYS
[J].
NUCLEAR INSTRUMENTS & METHODS,
1974, 119 (01)
:117-123
[7]
CHOICE OF PHYSICAL PARAMETERS IN CHARGED-PARTICLE INDUCED X-RAY-FLUORESCENCE ANALYSIS
[J].
INTERNATIONAL JOURNAL OF APPLIED RADIATION AND ISOTOPES,
1973, 24 (12)
:677-688
[8]
ANALYTICAL APPLICATION OF PARTICLE INDUCED X-RAY-EMISSION
[J].
NUCLEAR INSTRUMENTS & METHODS,
1976, 137 (03)
:473-516
[9]
ANALYSIS OF SULFUR IN PLANT MATERIAL
[J].
NUCLEAR INSTRUMENTS & METHODS,
1977, 142 (1-2)
:205-208
[10]
ABSOLUTE CALIBRATION OF ELECTROSTATIC ACCELERATORS IN ENERGY REGION FROM 0.7 MEV TO 2.1 MEV
[J].
NUCLEAR INSTRUMENTS & METHODS,
1973, 112 (03)
:489-494