SINGLE-ELECTRON TUNNELING IN TLBA2(CA0.8Y0.2)CU2O7 THIN-FILMS AT 10K

被引：6

作者：

MILLER, TG ^{[1
]}

REIFENBERGER, R ^{[1
]}

MCELFRESH, M ^{[1
]}

FACE, DW ^{[1
]}

HOLSTEIN, WL ^{[1
]}

机构：

[1] DUPONT CO INC,CENT R&D,WILMINGTON,DE 19880

来源：

JOURNAL OF LOW TEMPERATURE PHYSICS | 1994年 / 94卷 / 3-4期

关键词：

D O I：

10.1007/BF00754669

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Tunneling measurements on TiBa2(Ca0.8Y0.2)Cu2O7 taken at low temperatures with a scanning tunneling microscope reveal clear evidence of single electron tunneling behavior. Topographical studies of the film with both scanning tunneling microscopy and atomic force microscopy provide a simple explanation of the source of the ultra small capacitors necessary to explain the single electron tunneling spectra as a natural result of the planar crystal structure of TlBa2(Ca0.8Y0.2)Cu2O7.

引用

页码：239 / 247

页数：9

共 19 条

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