THE MECHANICAL-PROPERTIES OF THIN-FILMS - A REVIEW

[1] ANDEEN CG, 1977, 7TH P INT VAC C 3RD, P1769

[2] Anderson OL, 1973, ELASTIC CONSTANTS TH

[3] FIRST REPORT ON DEFORMATION-MECHANISM MAPS [J]. ACTA METALLURGICA, 1972, 20 (07): : 887 - +

[4] MECHANICAL-PROPERTIES OF COMPOSITION MODULATED CU-NI FOILS [J]. JOURNAL OF APPLIED PHYSICS, 1985, 57 (04) : 1076 - 1083

[5] Beams W., 1959, P INT C STRUCTURE PR, P183

[6] MECHANICAL PROPERTIES OF VACUUM-DEPOSITED GOLD FILMS [J]. JOURNAL OF APPLIED PHYSICS, 1964, 35 (06) : 1756 - &

[7] THE SUPERMODULUS EFFECT IN COMPOSITIONALLY MODULATED THIN-FILMS [J]. SCRIPTA METALLURGICA, 1986, 20 (04): : 479 - 486

[8] MECHANICAL-PROPERTIES OF THIN ALLOY-FILMS - ULTRAMICROHARDNESS AND INTERNAL-STRESS [J]. JOURNAL OF APPLIED PHYSICS, 1984, 55 (12) : 4248 - 4256

[9] A method for interpreting the data from depth-sensing indentation instruments [J]. JOURNAL OF MATERIALS RESEARCH, 1986, 1 (04) : 601 - 609

[10] Plastic properties of thin films on substrates as measured by submicron indentation hardness and substrate curvature techniques [J]. JOURNAL OF MATERIALS RESEARCH, 1986, 1 (06) : 845 - 851

[1] ANDEEN CG, 1977, 7TH P INT VAC C 3RD, P1769

[2] Anderson OL, 1973, ELASTIC CONSTANTS TH

[3] FIRST REPORT ON DEFORMATION-MECHANISM MAPS [J]. ACTA METALLURGICA, 1972, 20 (07): : 887 - +

[4] MECHANICAL-PROPERTIES OF COMPOSITION MODULATED CU-NI FOILS [J]. JOURNAL OF APPLIED PHYSICS, 1985, 57 (04) : 1076 - 1083

[5] Beams W., 1959, P INT C STRUCTURE PR, P183

[6] MECHANICAL PROPERTIES OF VACUUM-DEPOSITED GOLD FILMS [J]. JOURNAL OF APPLIED PHYSICS, 1964, 35 (06) : 1756 - &

[7] THE SUPERMODULUS EFFECT IN COMPOSITIONALLY MODULATED THIN-FILMS [J]. SCRIPTA METALLURGICA, 1986, 20 (04): : 479 - 486

[8] MECHANICAL-PROPERTIES OF THIN ALLOY-FILMS - ULTRAMICROHARDNESS AND INTERNAL-STRESS [J]. JOURNAL OF APPLIED PHYSICS, 1984, 55 (12) : 4248 - 4256

[9] A method for interpreting the data from depth-sensing indentation instruments [J]. JOURNAL OF MATERIALS RESEARCH, 1986, 1 (04) : 601 - 609

[10] Plastic properties of thin films on substrates as measured by submicron indentation hardness and substrate curvature techniques [J]. JOURNAL OF MATERIALS RESEARCH, 1986, 1 (06) : 845 - 851