LATEX AND SILICA BALLS MONOLAYERS FOR CALIBRATION AND FOR TIP CONTROL IN AFM

被引：2

作者：

BOISSET, MC

FRETIGNY, C

机构：

来源：

MICROSCOPY MICROANALYSIS MICROSTRUCTURES | 1994年 / 5卷 / 01期

关键词：

D O I：

10.1051/mmm:019940050107100

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

We propose the use of latex or silica balls deposited on mica or silicon to control the calibration of the scanners in AFM. A statistical method for the height measurement, based on an histogram analysis is given. Moreover, it is shown that the same samples can be used for tip characterisation.

引用

页码：71 / 77

页数：7

共 9 条

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BLUM AE, 1992, WATER ROCKS INTERACT

[2]

FLANDERS DC, 1983, J VAC SCI TECHNOL B, V1, P4

[3]

GRANIER V, 1992, EURADH 92

[4]

GRUTTER P, 1992, APPL PHYS LETT, V60, P2741, DOI 10.1063/1.106862