COMPARISON OF BASIC PRINCIPLES OF THE SURFACE-SPECIFIC ANALYTICAL METHODS - AES/SAM, ESCA (XPS), SIMS, AND ISS WITH X-RAY-MICROANALYSIS, AND SOME APPLICATIONS IN RESEARCH AND INDUSTRY

被引：41

作者：

HANTSCHE, H

机构：

来源：

关键词：

D O I：

10.1002/sca.4950110602

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：257 / 280

页数：24

共 148 条

[21]

BRIGGS D, 1979, SURFACE INTERFACE AN

[22]

BRIGGS D, 1977, HDB XRAY UV PHOTOELE

[23]

Brummer O., 1980, HDB FESTKORPERANALYS

[24] APPLICATION OF ELECTRON-SPECTROSCOPY TO SURFACE STUDIES [J].

BRUNDLE, CR .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1974, 11 (01) :212-224

[25]

BRUNDLE CR, 1980, ELECTRON SPECTROSCOP

[26]

BRUNDLE CR, 1978, ELECTRON SPECTROSCOP

[27]

BRUNDLE CR, 1977, ELECTRON SPECTROSCOP

[28]

BRUNDLE CR, 1979, ELECTRON SPECTROSCOP

[29]

BUCKLEY DH, 1977, INT ADV NONDESTRUCTI, V5, P303

[30]

BUNDLE CR, 1980, THIN SOLID FILMS, V72, P3