TRAPPING OF MINORITY CARRIERS IN SILICON .2. N-TYPE SILICON

被引:117
作者
HAYNES, JR
HORNBECK, JA
机构
来源
PHYSICAL REVIEW | 1955年 / 100卷 / 02期
关键词
D O I
10.1103/PhysRev.100.606
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:606 / 615
页数:10
相关论文
共 11 条
[1]   EFFECTIVE MASSES OF HOLES IN SILICON [J].
DEXTER, RN ;
LAX, B .
PHYSICAL REVIEW, 1954, 96 (01) :223-224
[2]  
EMIS R, 1954, Z NATURFORSCH A, V9, P67
[3]  
HANNAY, 1955, PHYS REV, V96, pA833
[4]  
HAYNES JR, 1954, PHYS REV, V94, P1438
[5]  
Herring C., 1955, FUNDAMENTAL FORMULAS
[6]   TRAPPING OF MINORITY CARRIERS IN SILICON .1. P-TYPE SILICON [J].
HORNBECK, JA ;
HAYNES, JR .
PHYSICAL REVIEW, 1955, 97 (02) :311-321
[7]   FLOATING ZONE CRYSTALLIZATION OF SILICON [J].
KECK, PH .
PHYSICA, 1954, 20 (11) :1059-1065
[8]   ELECTRICAL PROPERTIES OF SILICON CONTAINING ARSENIC AND BORON [J].
MORIN, FJ ;
MAITA, JP .
PHYSICAL REVIEW, 1954, 96 (01) :28-35
[9]  
MULLER S, 1954, Z NATURFORSCH B, V9, P504
[10]  
TEAL GK, 1950, PHYS REV, V78, P697