ADMITTANCE SPECTROSCOPY - A POWERFUL CHARACTERIZATION TECHNIQUE FOR SEMICONDUCTOR CRYSTALS - APPLICATION TO ZNTE

被引：133

作者：

PAUTRAT, JL

KATIRCIOGLU, B

MAGNEA, N

BENSAHEL, D

PFISTER, JC

REVOIL, L

机构：

来源：

SOLID-STATE ELECTRONICS | 1980年 / 23卷 / 11期

关键词：

D O I：

10.1016/0038-1101(80)90028-3

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1159 / 1169

页数：11

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