X-RAY MICROANALYTICAL SENSITIVITY AND SPATIAL-RESOLUTION IN SCANNING-TRANSMISSION ELECTRON-MICROSCOPES

被引：14

作者：

FAULKNER, RG ^{[1
]}

NORRGARD, K ^{[1
]}

机构：

[1] AB ATOMENERGI STUDSVIK,S-61101 NYKOPING 1,SWEDEN

来源：

X-RAY SPECTROMETRY | 1978年 / 7卷 / 04期

关键词：

D O I：

10.1002/xrs.1300070403

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：184 / 189

页数：6

共 14 条

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[3]

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[4] METALLURGICAL APPLICATIONS OF SCANNING-TRANSMISSION ELECTRON-MICROSCOPY [J].

EASTERLING, KE .

JOURNAL OF MATERIALS SCIENCE, 1977, 12 (05) :857-868

[5] IMPROVED SPATIAL-RESOLUTION MICROANALYSIS IN A SCANNING-TRANSMISSION ELECTRON-MICROSCOPE [J].

FAULKNER, RG ;

HOPKINS, TC ;

NORRGARD, K .

X-RAY SPECTROMETRY, 1977, 6 (02) :73-79

[6]

FAULKNER RG, 1976, 6TH P EUR REG C EL M, P465

[7] QUANTITATIVE X-RAY ENERGY DISPERSIVE ANALYSIS WITH TRANSMISSION ELECTRON-MICROSCOPE [J].

GEISS, RH ;

HUANG, TC .

X-RAY SPECTROMETRY, 1975, 4 (04) :196-201

[8]

Goldstein JI, 1977, SCANNING ELECTRON MI, V1, P315

[9] ANGULAR DISTRIBUTION OF CHARACTERISTIC X RADIATION + ITS ORIGIN WITHIN SOLID TARGET [J].

GREEN, M .

PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1964, 83 (5333) :435-+

[10]

KANICHEVA IR, 1964, SOV PHYS-SOL STATE, V5, P1870

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