PROTON-INDUCED X-RAY-EMISSION ANALYSIS OF THICK AND THIN TARGETS

被引：45

作者：

WILLIS, RD

WALTER, RL

SHAW, RW

GUTKNECHT, WF

机构：

[1] DUKE UNIV,DEPT PHYS,DURHAM,NC 27706

[2] TRIANGLE UNIV,NUCL LAB,DUKE STN,NC 27706

[3] DUKE UNIV,MED CTR,DEPT MED,DURHAM,NC 27706

[4] DUKE UNIV,DEPT CHEM,DURHAM,NC 27706

来源：

NUCLEAR INSTRUMENTS & METHODS | 1977年 / 142卷 / 1-2期

关键词：

D O I：

10.1016/0029-554X(77)90810-2

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：67 / 77

页数：11

共 13 条

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[9] QUANTITATIVE TRACE-ELEMENT ANALYSES IN THICK SAMPLES WITH HEAVY-ION-INDUCED X-RAY-FLUORESCENCE [J].

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