DEEP UV PHOTOCHEMISTRY AND PATTERNING OF SELF-ASSEMBLED MONOLAYER FILMS

被引:56
作者
CALVERT, JM
GEORGER, JH
PECKERAR, MC
PEHRSSON, PE
SCHNUR, JM
SCHOEN, PE
机构
[1] USN,RES LAB,NANOELECTR PROC FACIL,WASHINGTON,DC 20375
[2] USN,RES LAB,DIV CHEM,WASHINGTON,DC 20375
[3] GEOCENTERS INC,FT WASHINGTON,MD 20744
关键词
D O I
10.1016/0040-6090(92)90257-C
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Patterned deep UV irradiation of organosilane self-assembled monolayer (SAM) films caused photocleavage of the organic groups in the molecule, and creates alternating regions of intact film and hydrophilic, surface silanol moieties. The exposed regions can undergo a second chemisorption reaction to produce an assembly of SAMs in the same molecular plane. The patterned SAM films can also act as a template for selective build-up of materials in the z-direction. The use of UV patterned silane SAM films as imaging layers for optical lithography has been demonstrated. The exposed films are selectively metallized using electroless deposition to produce a thin metal layer only in the unexposed areas. The film/metal assembly is a highly resistive barrier to reactive ion etching (RIE) for pattern transfer into the substrate. Features to 0.5-mu-m line width and working transistor test structures have been produced using this process.
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页码:359 / 363
页数:5
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