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FIRST RESULTS WITH AMPLITUDE-MODULATION REFLECTOMETRY ON THE PBX-M TOKAMAK
被引:12
作者
:
DELALUNA, E
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
DELALUNA, E
SANCHEZ, J
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
SANCHEZ, J
ZHURAVLEV, V
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
ZHURAVLEV, V
GARCIACORTES, I
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
GARCIACORTES, I
HANSON, GR
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
HANSON, GR
WILGEN, JB
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
WILGEN, JB
HARRIS, JH
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
HARRIS, JH
DUNLAP, J
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
DUNLAP, J
KAITA, R
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
KAITA, R
LEBLANC, B
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
LEBLANC, B
TYNAN, GR
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
TYNAN, GR
SCHMITZ, L
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
SCHMITZ, L
BLUSH, L
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
BLUSH, L
机构
:
[1]
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
[2]
PRINCETON PLASMA PHYS LAB,PRINCETON,NJ 08543
[3]
UNIV CALIF LOS ANGELES,INST PLASMA & FUS RES,LOS ANGELES,CA 90024
来源
:
REVIEW OF SCIENTIFIC INSTRUMENTS
|
1995年
/ 66卷
/ 01期
关键词
:
D O I
:
10.1063/1.1146540
中图分类号
:
TH7 [仪器、仪表];
学科分类号
:
0804 ;
080401 ;
081102 ;
摘要
:
Electron density profile measurements have been obtained on PBX-M by amplitude modulation reflectometry. With this technique, the measurement of the time delay is obtained from the phase delay of the modulating envelope (200 MHz in PBX-M). The system operates with the extraordinary mode, in the range 32-50 GHz. Under these conditions the density profile of PBX-M can be probed from the scrape-off layer up to typically r/a=0.7. With a final bandwidth of 40 kHz, the reflectometer is able to obtain the edge profile in 1 ms. The profiles obtained are relatively noise free and in good agreement with Thomson scattering measurements. Perturbations due to the strong-edge turbulence are kept to a minimum, and no software filtering or other signal processing was necessary to extract the time delay information from the raw data. Profiles have been measured for ohmic and Neutron Beam Injection heated discharges. © 1995 American Institute of Physics.
引用
收藏
页码:403 / 405
页数:3
相关论文
共 6 条
[1]
DELALUNA E, 1993, 20TH P EPS C CONTR F, V17, P1159
[2]
A SWEPT 2-FREQUENCY MICROWAVE REFLECTOMETER FOR EDGE DENSITY PROFILE MEASUREMENTS ON TFTR
HANSON, GR
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
HANSON, GR
WILGEN, JB
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
WILGEN, JB
BIGELOW, TS
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
BIGELOW, TS
COLLAZO, I
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
COLLAZO, I
THOMAS, CE
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
THOMAS, CE
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1992,
63
(10)
: 4658
-
4660
[3]
AMPLITUDE-MODULATION REFLECTOMETRY FOR LARGE FUSION DEVICES
SANCHEZ, J
论文数:
0
引用数:
0
h-index:
0
机构:
Asociación EURATOM/CIEMAT 28040, Madrid
SANCHEZ, J
BRANAS, B
论文数:
0
引用数:
0
h-index:
0
机构:
Asociación EURATOM/CIEMAT 28040, Madrid
BRANAS, B
ESTRADA, T
论文数:
0
引用数:
0
h-index:
0
机构:
Asociación EURATOM/CIEMAT 28040, Madrid
ESTRADA, T
DELALUNA, E
论文数:
0
引用数:
0
h-index:
0
机构:
Asociación EURATOM/CIEMAT 28040, Madrid
DELALUNA, E
ZHURAVLEV, V
论文数:
0
引用数:
0
h-index:
0
机构:
Asociación EURATOM/CIEMAT 28040, Madrid
ZHURAVLEV, V
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1992,
63
(10)
: 4654
-
4656
[4]
STEK PC, 1994, P IAEA TECHNICAL M M
[5]
Vershkov V. A., 1987, Soviet Physics - Technical Physics, V32, P523
[6]
WILGEN JB, 1993, B AM PHYS SOC, V38, P2096
←
1
→
共 6 条
[1]
DELALUNA E, 1993, 20TH P EPS C CONTR F, V17, P1159
[2]
A SWEPT 2-FREQUENCY MICROWAVE REFLECTOMETER FOR EDGE DENSITY PROFILE MEASUREMENTS ON TFTR
HANSON, GR
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
HANSON, GR
WILGEN, JB
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
WILGEN, JB
BIGELOW, TS
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
BIGELOW, TS
COLLAZO, I
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
COLLAZO, I
THOMAS, CE
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
OAK RIDGE NATL LAB,OAK RIDGE,TN 37831
THOMAS, CE
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1992,
63
(10)
: 4658
-
4660
[3]
AMPLITUDE-MODULATION REFLECTOMETRY FOR LARGE FUSION DEVICES
SANCHEZ, J
论文数:
0
引用数:
0
h-index:
0
机构:
Asociación EURATOM/CIEMAT 28040, Madrid
SANCHEZ, J
BRANAS, B
论文数:
0
引用数:
0
h-index:
0
机构:
Asociación EURATOM/CIEMAT 28040, Madrid
BRANAS, B
ESTRADA, T
论文数:
0
引用数:
0
h-index:
0
机构:
Asociación EURATOM/CIEMAT 28040, Madrid
ESTRADA, T
DELALUNA, E
论文数:
0
引用数:
0
h-index:
0
机构:
Asociación EURATOM/CIEMAT 28040, Madrid
DELALUNA, E
ZHURAVLEV, V
论文数:
0
引用数:
0
h-index:
0
机构:
Asociación EURATOM/CIEMAT 28040, Madrid
ZHURAVLEV, V
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1992,
63
(10)
: 4654
-
4656
[4]
STEK PC, 1994, P IAEA TECHNICAL M M
[5]
Vershkov V. A., 1987, Soviet Physics - Technical Physics, V32, P523
[6]
WILGEN JB, 1993, B AM PHYS SOC, V38, P2096
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1
→