PHOSPHOSILICATE GLASS STABILIZATION OF MOS STRUCTURES

[1] STUDIES OF SODIUM IN SIO2 FILMS BY NEUTRON ACTIVATION AND RADIOTRACER TECHNIQUES [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1967, 114 (08) : 862 - +

[2] POLARIZATION OF THIN PHOSPHOSILICATE GLASS FILMS IN MGOS STRUCTURES [J]. JOURNAL OF APPLIED PHYSICS, 1969, 40 (04) : 1922 - +

[3] ELDRIDGE JM, 1968, T METALL SOC AIME, V242, P539

[4] ELDRIDGE JM, 1968, OCT EL SOC FALL M MO, P530

[5] STABILIZATION OF MOS DEVICES [J]. SOLID-STATE ELECTRONICS, 1967, 10 (07) : 657 - +

[6] KERR DR, 1964, IBM J RES DEVELOP, V8, P377

[7] MONTILLO FJ, UNPUBLISHED WORK

[8] OROURKE G, UNPUBLISHED WORKS

[9] POLARIZATION PHENOMENA AND OTHER PROPERTIES OF PHOSPHOSILICATE GLASS FILMS ON SILICON [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1966, 113 (03) : 263 - &

[10] YON E, 1966, IEEE T ELECTRON DEV, VED13, P276

[1] STUDIES OF SODIUM IN SIO2 FILMS BY NEUTRON ACTIVATION AND RADIOTRACER TECHNIQUES [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1967, 114 (08) : 862 - +

[2] POLARIZATION OF THIN PHOSPHOSILICATE GLASS FILMS IN MGOS STRUCTURES [J]. JOURNAL OF APPLIED PHYSICS, 1969, 40 (04) : 1922 - +

[3] ELDRIDGE JM, 1968, T METALL SOC AIME, V242, P539

[4] ELDRIDGE JM, 1968, OCT EL SOC FALL M MO, P530

[5] STABILIZATION OF MOS DEVICES [J]. SOLID-STATE ELECTRONICS, 1967, 10 (07) : 657 - +

[6] KERR DR, 1964, IBM J RES DEVELOP, V8, P377

[7] MONTILLO FJ, UNPUBLISHED WORK

[8] OROURKE G, UNPUBLISHED WORKS

[9] POLARIZATION PHENOMENA AND OTHER PROPERTIES OF PHOSPHOSILICATE GLASS FILMS ON SILICON [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1966, 113 (03) : 263 - &

[10] YON E, 1966, IEEE T ELECTRON DEV, VED13, P276