QUANTITATIVE PHOTO-ELASTIC MEASUREMENT OF RESIDUAL-STRESS IN LEC GROWN GAP CRYSTALS

被引：15

作者：

KOTAKE, H

HIRAHARA, K

WATANABE, M

机构：

来源：

JOURNAL OF CRYSTAL GROWTH | 1980年 / 50卷 / 03期

关键词：

D O I：

10.1016/0022-0248(80)90021-4

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：743 / 751

页数：9

共 10 条

[1]

Bass S. J., 1968, Journal of Crystal Growth, V3-4Spe, P286, DOI 10.1016/0022-0248(68)90155-3

[2] MEASUREMENT OF REFRACTIVE INDICES OF SEVERAL CRYSTALS [J].

BOND, WL .

JOURNAL OF APPLIED PHYSICS, 1965, 36 (05) :1674-&

[3] PHOTOELASTIC PROPERTIES OF SELECTED MATERIALS AND THEIR RELEVANCE FOR APPLICATIONS TO ACOUSTIC LIGHT MODULATORS AND SCANNERS [J].

DIXON, RW .

JOURNAL OF APPLIED PHYSICS, 1967, 38 (13) :5149-+

[4]

HEYWOOD RB, 1969, PHOTOELASTICITY DESI, P56

[5] QUANTITATIVE MEASUREMENT OF STRESS IN SILICON BY PHOTOELASTICITY AND ITS APPLICATION [J].

KOTAKE, H ;

TAKASU, S .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1980, 127 (01) :179-184

[6] INFRARED STUDIES OF BIREFRINGENCE IN SILICON [J].

LEDERHANDLER, SR .

JOURNAL OF APPLIED PHYSICS, 1959, 30 (11) :1631-1638

[7] ELECTRO-OPTIC AND PIEZOELECTRIC COEFFICIENTS AND REFRACTIVE INDEX OF GALLIUM PHOSPHIDE [J].

NELSON, DF ;

TURNER, EH .

JOURNAL OF APPLIED PHYSICS, 1968, 39 (07) :3337-&

[8] LIQUID ENCAPSULATED CZOCHRALSKI GROWTH OF 35 MM DIAMETER SINGLE-CRYSTALS OF GAP [J].

NYGREN, SF .

JOURNAL OF CRYSTAL GROWTH, 1973, 19 (01) :21-32

[9]

TAKAHAMA K, 1974, SANYO TECH REV, V6, P3

[10] ELASTIC CONSTANTS OF GALLIUM PHOSPHIDE [J].

WEIL, R ;

GROVES, WO .

JOURNAL OF APPLIED PHYSICS, 1968, 39 (09) :4049-&

← 1 →