DIFFUSION IN A SHORT BASE

被引:13
作者
HANSEN, O
机构
[1] Mikroelektronik Centret, The Technical University of Denmark, DK-2800 Lyngby
关键词
D O I
10.1016/0038-1101(94)90049-3
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Based on the solution of the Boltzmann transport equation for a homogeneous base transistor [A. A. Grinberg and S. Luryi, Solid-St. Electron, 35, 1299 (1992)] a very instructive model of carrier transport in a short base transistor is developed. Essential to the above is a replacement of the Schottky boundary conditions. Using modified boundary conditions to the diffusion equation, the transport current density in a homogeneous base is predicted, to an accuracy within +/- 3%, regardless of the base width, covering the whole range from the diffusion controlled regime to the thermionic regime. Based on the modified boundary conditions a corrected Moll-Ross-Kroemer relation valid for a very short non-homogeneous base is derived. Correspondingly, an expression for the base transit time is derived.
引用
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页码:1663 / 1669
页数:7
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