CORRELATION OF I-V CHARACTERISTIC WITH NOISE FOR ION DRIFTED P-I-N JUNCTION PARTICLE DETECTORS

被引:12
作者
MONTEITH, LK
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D O I
10.1063/1.1718828
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TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
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页码:388 / &
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[1]   SPACECRAFT RADIATION EXPERIMENTS [J].
BROWN, WL ;
SMITS, FM ;
MEDFORD, LV ;
GUMMEL, HK ;
MILLER, GL ;
THOMAS, EW ;
BUCK, TM .
BELL SYSTEM TECHNICAL JOURNAL, 1963, 42 (02) :899-+
[2]   EFFECTS OF CERTAIN CHEMICAL TREATMENTS AND AMBIENT ATMOSPHERES ON SURFACE PROPERTIES OF SILICON [J].
BUCK, TM ;
MCKIM, FS .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1958, 105 (12) :709-714
[3]  
CHASE RL, 1961, IRE T, VNS8, P147
[4]  
FAIRSTEIN E, 1961, NASNSS32 NATL AC SCI, P111
[5]  
GILLESPIE AB, 1953, SIGNAL NOISE RESOLUT
[6]  
GOULDING FS, 1960, UCRL9436 RAD LAB REP
[7]   ELECTRON MULTIPLICATION IN SILICON AND GERMANIUM [J].
MCKAY, KG ;
MCAFEE, KB .
PHYSICAL REVIEW, 1953, 91 (05) :1079-1084
[8]   ELECTRICAL NOISE IN SEMICONDUCTORS [J].
MONTGOMERY, HC .
BELL SYSTEM TECHNICAL JOURNAL, 1952, 31 (05) :950-975
[9]   ION DRIFT IN AN N-P JUNCTION [J].
PELL, EM .
JOURNAL OF APPLIED PHYSICS, 1960, 31 (02) :291-302
[10]   THEORY AND EXPERIMENTS ON SHOT NOISE IN SILICON P-N JUNCTION DIODES AND TRANSISTORS [J].
SCHNEIDER, B ;
STRUTT, MJO .
PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1959, 47 (04) :546-554