TIME-DEPENDENCE OF INTERFACE TRAP FORMATION IN MOSFETS FOLLOWING PULSED IRRADIATION

被引：108

作者：

SAKS, NS

DOZIER, CM

BROWN, DB

机构：

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1988年 / 35卷 / 06期

关键词：

D O I：

10.1109/23.25435

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：1168 / 1177

页数：10

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