ATOMIC FORCE MICROSCOPE STUDIES OF FULLERENE FILMS - HIGHLY STABLE C60 FCC(311) FREE SURFACES

被引：60

作者：

SNYDER, EJ

ANDERSON, MS

TONG, WM

WILLIAMS, RS

ANZ, SJ

ALVAREZ, MM

RUBIN, Y

DIEDERICH, FN

WHETTEN, RL

机构：

[1] CALTECH,JET PROP LAB,PASADENA,CA 91109

[2] UNIV CALIF LOS ANGELES,CTR SOLID STATE SCI,LOS ANGELES,CA 90024

来源：

SCIENCE | 1991年 / 253卷 / 5016期

关键词：

D O I：

10.1126/science.253.5016.171

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

Atomic force microscopy and x-ray diffractometry were used to study 1500 angstrom-thick films of pure C60 grown by sublimation in ultrahigh vacuum onto a CaF2 (111) substrate. Topographs of the films did not reveal the expected close-packed structures, but they showed instead large regions that correspond to a face-centered cubic (311) surface and distortions of this surface. The open (311) structure may have a relatively low free energy because the low packing density contributes to a high entropy of the exposed surface.

引用

页码：171 / 173

页数：3

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