ANGLE-SCANNED PHOTOELECTRON DIFFRACTION

被引:67
作者
OSTERWALDER, J
AEBI, P
FASEL, R
NAUMOVIC, D
SCHWALLER, P
KREUTZ, T
SCHLAPBACH, L
ABUKAWA, T
KONO, S
机构
[1] UNIV FRIBOURG, INST PHYS, CH-1700 FRIBOURG, SWITZERLAND
[2] TOHOKU UNIV, RISM, SENDAI, MIYAGI 980, JAPAN
关键词
PHOTOELECTRON DIFFRACTION; SURFACE STRUCTURE;
D O I
10.1016/0039-6028(95)00076-3
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A brief survey is given on the current state-of-the-art of this surface structural technique based on photoelectron spectroscopy, with particular emphasis on the progress that has been made recently by routinely measuring full-hemispherical intensity distributions. We limit the discussion to the photoelectron forward focusing regime, which is attained at electron kinetic energies of a few hundred eV. Surface bond directions are directly revealed as pronounced maxima in the angular distributions from subsurface atoms, while characteristic interference features are observed for surface species. For both cases the dependence on the atomic type is weak enough so that these features provide a fingerprint of the local bonding geometry. For surface and near-surface species, this may then serve as a starting point for a structure refinement using single-scattering cluster calculations. Selected examples are given for illustrating these procedures.
引用
收藏
页码:1002 / 1014
页数:13
相关论文
共 54 条
  • [21] DIRECT STRUCTURAL INFORMATION FROM X-RAY PHOTOELECTRON DIFFRACTION - INTERMIXING AND ON-SURFACE ADSORPTION OF NA ON AL SURFACES
    FASEL, R
    AEBI, P
    OSTERWALDER, J
    SCHLAPBACH, L
    [J]. SURFACE SCIENCE, 1995, 331 : 80 - 87
  • [22] FRANCIS C, 1991, PARERGON, V9, P158
  • [24] AUGER-ELECTRON AND PHOTOELECTRON ANGULAR-DISTRIBUTIONS FROM SURFACES - IMPORTANCE OF THE ELECTRON SOURCE WAVE
    GREBER, T
    OSTERWALDER, J
    NAUMOVIC, D
    STUCK, A
    HUFNER, S
    SCHLAPBACH, L
    [J]. PHYSICAL REVIEW LETTERS, 1992, 69 (13) : 1947 - 1950
  • [25] GUNNELLA R, IN PRESS
  • [26] STRUCTURAL CHARACTERIZATION BY LOW-ENERGY AUGER-ELECTRON AND PHOTOELECTRON SCATTERING
    IDZERDA, YU
    RAMAKER, DE
    [J]. PHYSICAL REVIEW LETTERS, 1992, 69 (13) : 1943 - 1946
  • [27] APPLICATION OF A NOVEL MULTIPLE-SCATTERING APPROACH TO PHOTOELECTRON DIFFRACTION AND AUGER-ELECTRON DIFFRACTION
    KADUWELA, AP
    FRIEDMAN, DJ
    FADLEY, CS
    [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1991, 57 (3-4) : 223 - 278
  • [28] DEVELOPMENTS OF A SURFACE-ANALYSIS APPARATUS AND TECHNIQUES USING MICRO-PROBE ELECTRON-BEAMS
    KONO, S
    NAKAMURA, N
    ANNO, K
    TERUYAMA, S
    [J]. SURFACE SCIENCE, 1992, 271 (03) : 596 - 604
  • [29] A TOROIDAL ANGLE-RESOLVING ELECTRON SPECTROMETER FOR SURFACE STUDIES
    LECKEY, RCG
    RILEY, JD
    [J]. APPLICATIONS OF SURFACE SCIENCE, 1985, 22-3 (MAY): : 196 - 205
  • [30] MULTIPLE-SCATTERING APPROACH TO ANGLE-RESOLVED PHOTOEMISSION
    LI, CH
    LUBINSKY, AR
    TONG, SY
    [J]. PHYSICAL REVIEW B, 1978, 17 (08): : 3128 - 3142