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1 MU-M MOSFET VLSI TECHNOLOGY .2. DEVICE DESIGNS AND CHARACTERISTICS FOR HIGH-PERFORMANCE LOGIC APPLICATIONS
被引:41
作者
:
DENNARD, RH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM Thomas J. Watson Research Center, Yorktown Heights
DENNARD, RH
GAENSSLEN, FH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM Thomas J. Watson Research Center, Yorktown Heights
GAENSSLEN, FH
WALKER, EJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM Thomas J. Watson Research Center, Yorktown Heights
WALKER, EJ
COOK, PW
论文数:
0
引用数:
0
h-index:
0
机构:
IBM Thomas J. Watson Research Center, Yorktown Heights
COOK, PW
机构
:
[1]
IBM Thomas J. Watson Research Center, Yorktown Heights
来源
:
IEEE TRANSACTIONS ON ELECTRON DEVICES
|
1979年
/ 26卷
/ 04期
关键词
:
D O I
:
10.1109/T-ED.1979.19431
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
Micrometer-dimension n-channel silicon-gate MOSFET's optimized for high-performance logic applications have been designed and characterized for both room-temperature and liquid-nitrogen-tem-perature operation. Appropriate choices of design parameters are shown to give proper device thresholds which are reasonably independent of channel length and width. Depletion-type devices are characterized at room temperature for load device use. Logic performance capability is demonstrated by test results on NOR circuits for representative fanout and loading conditions. Unloaded ring oscillators achieved switching delays down to 240 Ps at room temperature and down to 100 Ps at liquid nitrogen temperature. Copyright © 1979 by The Institute of Electrical and Electronics Engineers, Inc.
引用
收藏
页码:325 / 333
页数:9
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共 12 条
[11]
2-DIMENSIONAL MATHEMATICAL-MODEL OF INSULATED-GATE FIELD-EFFECT TRANSISTOR
MOCK, MS
论文数:
0
引用数:
0
h-index:
0
机构:
IBM COMPONENTS DIV, E FISHKILL LABS, HOPEWELL JUNCTION, NY 12533 USA
MOCK, MS
[J].
SOLID-STATE ELECTRONICS,
1973,
16
(05)
: 601
-
609
[12]
FABRICATION OF A MINIATURE 8K-BIT MEMORY CHIP USING ELECTRON-BEAM EXPOSURE
YU, HN
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
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DENNARD, RH
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0
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0
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OSBURN, CM
DILONARDO, V
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0
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0
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IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
DILONARDO, V
LUHN, HE
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JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
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←
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