A COMPUTER-ANALYSIS OF EFFECTS OF ANNEALING ON INP INSULATOR-SEMICONDUCTOR INTERFACE PROPERTIES USING MIS C-V CURVES

被引：30

作者：

HE, L

HASEGAWA, H

SAWADA, T

OHNO, H

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1988年 / 27卷 / 04期

关键词：

D O I：

10.1143/JJAP.27.512

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：512 / 521

页数：10

共 31 条

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