STACKING FAULTS IN CHEMICALLY-VAPOR-DEPOSITED BETA SILICON CARBIDE

被引：10

作者：

GULDEN, TD

机构：

来源：

JOURNAL OF THE AMERICAN CERAMIC SOCIETY | 1971年 / 54卷 / 10期

关键词：

D O I：

10.1111/j.1151-2916.1971.tb12187.x

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：498 / &

共 13 条

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[2] THE DETERMINATION OF THE TYPE OF STACKING FAULTS IN FACE CENTERED CUBIC ALLOYS BY MEANS OF CONTRAST EFFECTS IN THE ELECTRON MICROSCOPE [J].

ART, A ;

GEVERS, R ;

AMELINCKX, S .

PHYSICA STATUS SOLIDI, 1963, 3 (04) :697-711

[3] IMPERFECTIONS IN SOLUTION-GROWN BETA-SILICON CARBIDE CRYSTALS [J].

BARTLETT, RW ;

MARTIN, GW .

JOURNAL OF APPLIED PHYSICS, 1968, 39 (05) :2324-+

[4]

FRANK FC, 1951, PHILOS MAG, V42, P809

[5] DEPOSITION AND MICROSTRUCTURE OF VAPOR-DEPOSITED SILICON CARBIDE [J].

GULDEN, TD .

JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1968, 51 (08) :424-&

[6]

Howie A., 1963, PHILOS MAG, V8, P1981

[7] EXTENDED DISLOCATION NODES IN A SILVER-TIN ALLOY [J].

IVES, LK ;

RUFF, AW .

JOURNAL OF APPLIED PHYSICS, 1966, 37 (04) :1831-&

[8] ORIENTATION OF STACKING FAULTS AND DISLOCATION ETCH PITS IN BETA-SIC [J].

LIEBMANN, WK .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1964, 111 (07) :885-886

[9] STACKING FAULTS IN EPITAXIAL SILICON [J].

QUEISSER, HJ ;

FINCH, RH ;

WASHBURN, J .

JOURNAL OF APPLIED PHYSICS, 1962, 33 (04) :1536-&

[10] FRINGE PATTERNS AT ANTI-PHASE BOUNDARIES WITH ALPHA = PI OBSERVED IN THE ELECTRON MICROSCOPE [J].

VANLANDUYT, J ;

GEVERS, R ;

AMELINCKX, S .

PHYSICA STATUS SOLIDI, 1964, 7 (02) :519-546

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