LOWER-SUBMICRON PATTERNING PROCESS FOR BISRCACUO HIGH-TC SUPERCONDUCTING THIN-FILMS

被引:4
作者
FUJIWARA, S
YUASA, R
FURUKAWA, H
NAKAO, M
SUZUKI, S
机构
[1] SANYO Tsukuba Research Center, Tsukuba, Ibaraki, 305
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1993年 / 32卷 / 1B期
关键词
HIGH-TC SUPERCONDUCTING THIN FILM; BISRCACUO SYSTEM; MICROFABRICATION; BR-2; SOLUTION; FOCUSED ION BEAM; ION BOMBARDMENT ENHANCED ETCHING;
D O I
10.1143/JJAP.32.685
中图分类号
O59 [应用物理学];
学科分类号
摘要
Ion bombardment enhanced etching (IBEE) has been successfully applied to BiSrCaCuO high-T(c) superconducting thin films using nonaqueous Br2 solution. It was found that the etch rate of the damaged region which was formed by the ion irradiation with a 200 keV Si++ focused ion beam was enhanced with the Br2 treatment. The critical dose of the IBEE process was about 1 X 10(14) ions/cm2, which is roughly the same as the dose which destroys the superconductivity of the film. Bridge structures with a width of 0.2 mum were successfully fabricated with little degradation in T(c) and J(c). The 0.2-mum bridge had a J(c) value of more than 10(5) A/cm2 below 20 K.
引用
收藏
页码:685 / 688
页数:4
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